Canada Analytical & Process Technologies
Search Site  
 Home / Products / Thin Film Analyzers & Controllers

 RQCM

RQCM
Maxtek RQCM Quartz Crystal Microbalance Research System
RQCM is a highly advanced method of measuring film properties during processes such as deposition, dissolution or permeation. Up to three crystals can be measured simultaneously with <0.4 ng/cm 2 mass resolution. All data is logged and graphically displayed using integrated Windows®-based software in real time.

For more information, click here

  Phone: (613) 226-1115    Fax: (613) 226-5429    E-mail: info@captcanada.com